WebRun a 10 to 30 minute oxygen clean, Pressure = 200mTorr, O2=18sccm, power = 300W. 8.Place your wafer in the chamber. 9.Firmly hold the lid to the chamber down and evacuate the chamber by choosing: “Utilities”=> “Pump Chamber”=> “LoVacuum”. Once the chamber is under vacuum you may stop holding the lid down. WebThe decomposition of trifluoromethane (CHF3) was carried out using non-thermal plasma generated in a dielectric barrier discharge (DBD) reactor. The effects of reactor temperature, electric power, initial concentration …
Thermal Abatement of Perfluorocompounds with plasma torches
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WebDry etching of amorphous silicon nitride (Si3N4) selectively toward silicon dioxide (SiO2), silicon oxicarbide (SiCO), and crystalline silicon (c-Si) in an inductive coupled plasma reactor using CHF3/O2/He chemistry with SiCl4 addition is studied. Plasma exposure of c-Si, SiO2, and SiCO leads to an oxifluoride deposition. The deposition rate is the same for … WebMay 1, 2007 · The etching characteristics of Ge 2 Sb 2 Te 5 (GST) films were studied with a CHF 3 /O 2 gas mixture using a reactive ion etching system. The variations of etch rates and etch profiles caused by changes in the gas-mixing ratio were investigated under constant pressure and applying power. Then the etching parameters were optimized. The etch … Webdepends on the F density in the plasma and the effects of ion bombardment. The process conditions for a high etch selectivity are a 0.3 to 0.5 CF4 flow ratio and a –600 V to –650 V DC bias voltage according to the process pressure in our experiment. Etching uniformity was improved with an increase in the CF4 flow ratio in the gas mixture, an pokemon black wa